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Journal of Peking University (Health Sciences) ›› 2021, Vol. 53 ›› Issue (1): 46-53. doi: 10.19723/j.issn.1671-167X.2021.01.008

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Effects of three self-etch adhesives and mild salivary contamination on the bonding durability of deciduous teeth

LUO Chi-yi,PENG Chu-fang,YANG Yuan,QIN Man,WANG Yuan-yuan()   

  1. Department of Pediatric Dentistry, Peking University School and Hospital of Stomatology & National Clinical Research Center for Oral Disease & National Engineering Laboratory for Digital and Material Technology of Stomatology & Beijing Key Laboratory of Digital Stomatology, Beijing 100081, China
  • Received:2020-09-21 Online:2021-02-18 Published:2021-02-07
  • Contact: Yuan-yuan WANG E-mail:cwyyd@126.com
  • Supported by:
    Chinese Stomatological Association Youth Clinical Research Foundation(CSA-B2018-10)

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Abstract:

Objective: To compare the bonding durability of three different self-etch adhesives to primary enamel and dentin, and to investigate the effect of mild salivary contamination followed by air drying on the bonding durability.Methods: Two hundred and forty enamel specimens were divided randomly into 16 groups (n=15/group)according to the adhesive system [self-etch adhesives: Clearfil SE Bond(SE), AdperTM Easy One (EO), Scotchbond Universal (SBU); total-etch adhesive: AdperTM Single Bond Plus(SL)], contamination status (non-contaminated vs. salivary-contaminated ) and storage condition (stored in distilled water for 24 h vs. aging mode 5 000 thermal cycles in 5 ℃ and 55 ℃). Two hundred and forty dentin specimens were assigned in the same way. Shear bond strength for 12 specimens in each group were measured. The adhesive interface for the residual specimens in each group was observed by scanning electron microscopy(SEM). Data were analyzed by three-way analysis of variance and Tukey test(P<0.05).Results: For primary enamel, total-etch adhesive showed higher initial shear bond strength values (28.92±1.83) MPa and shear bond strength values (27.27±3.03) MPa after thermal cycles compared with the other groups, and the difference between the groups was statistically significant (P<0.01). Shear bond strength values of EO decreased significantly in salivary-treated groups, regardless of storage conditions, and the difference was statistically significant (P<0.01). For primary dentin, shear bond strength values of EO decreased significantly in salivary-treated groups after 24 h (P<0.01). After 5 000 thermal cycles, total-etch adhesive showed significantly lower shear bond strength values (14.31±1.97) MPa compared with the other groups, and the difference between the groups was statistically significant (P<0.01), and shear bond strength values of EO were significantly lower than those in SE and SBU groups (P<0.01), regardless of contamination status.Conclusion: Total-etch adhesive SL has better bonding durability to primary enamel. SE and SBU have better bonding durability to primary dentin and have a certain resistance to salivary contamination, while the bonding performance of EO is compromised greatly by mild salivary contamination followed by air drying.

Key words: Primary teeth, Enamel, Dentin, Self-etch, Salivary contamination

CLC Number: 

  • R788.4

Figure 1

The establishment of bonding sample A, the applied adhesive system for setting up the bonding sample; B, a drop of saliva (6 μL) placed on the defined bonding area to establish the contaminated sample."

Table 1

Three-way analysis of variance for the SBS tests to primary enamel"

Factors Sum of squares df Mean square F-ratio P value
Adhesive 3 358.52 3 1 119.51 72.88 <0.001
Contamination 792.74 1 792.74 51.61 <0.001
Storage 0.06 1 0.06 0.00 0.952
Adhesive×contamination 180.41 3 60.14 3.92 0.010
Adhesive×storage 65.28 3 21.76 1.42 0.240
Contamination×storage 3.59 1 3.59 0.23 0.630
Adhesive×contamination×storage 6.11 3 2.04 0.13 0.941

Figure 2

Distribution of failure modes (primary enamel groups) I, initial; T, thermal cycling; N, non-contaminated; C, contaminated; SL, AdperTM Single Bond Plus; SE, Clearfil SE Bond; EO, AdperTM Easy One; SBU, Scotchbond Universal."

Figure 3

Representative scanning electron microscope images resin-enamel interfaces with salivary contamination A, B, resin-enamel interfaces with salivary contamination were observed by SEM after 5 000 thermal cycles in 5 ℃ and 55 ℃, representative SEM images of SL group at magnifications of ×500 and ×1 500; C, D, representative SEM images of SE group at magnifications of ×500 and ×1 500; E, F, representative SEM images of EO group at magnifications of ×500 and ×1 500; G, H, representative SEM images of SBU group at magnifications of ×500 and ×1 500. SL, AdperTM Single Bond Plus; SE, Clearfil SE Bond; EO, AdperTM Easy One; SBU, Scotchbond Universal; SEM, scanning electron microscope."

Table 2

Three-way analysis of variance for the SBS tests to primary dentin"

Factors Sum of squares df Mean square F-ratio P value
Adhesive 1 392.80 3 464.27 32.56 <0.001
Contamination 295.43 1 295.43 20.72 <0.001
Storage 22.86 1 22.86 1.60 0.207
Adhesive×contamination 74.57 3 24.86 1.74 0.160
Adhesive×storage 341.00 3 113.67 7.97 <0.001
Contamination×storage 9.11 1 9.11 0.64 0.425
Adhesive×contamination×storage 13.17 3 4.39 0.31 0.820

Figure 4

Distribution of failure modes (primary dentin groups) I, initial; T, thermal cycling; N, non-contaminated; C, contaminated; SL, AdperTM Single Bond Plus; SE, Clearfil SE Bond; EO, AdperTM Easy One; SBU, Scotchbond Universal."

Figure 5

Representative scanning electron microscopy images resin-dentin interfaces with salivary contamination A, B, resin-dentin interfaces with salivary contamination were observed by SEM after 5 000 thermal cycles in 5 ℃ and 55 ℃, representative SEM images of SL group at magnifications of ×500 and ×1 500; C, D, representative SEM images of SE group at magnifications of ×500 and ×1 500; E, F, representative SEM images of EO group at magnifications of ×500 and ×1 500; G, H, representative SEM images of SBU group at magnifications of ×500 and ×1 500. SL, AdperTM Single Bond Plus; SE, Clearfil SE Bond; EO, AdperTM Easy One; SBU, Scotchbond Universal; SEM, scanning electron microscope."

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